Variability studies of yield related traits and its correlation in advance segregating populations of sweet corn

Authors

  • Senthil Natesan Centre for Plant Molecular Biology and Biotechnology, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Abikkumar Chellamuthu Department of Plant Biotechnology, Centre for Plant Molecular Biology and Biotechnology, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Monisha Chokkalingam Department of Genetics and Plant Breeding, Center for Plant Breeding and Genetics, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Mohanapriya Balamurugan Department of Plant Molecular Biology and Bioinformatics, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Sivakumar Subburayan Department of Millets, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Gurusamy Kandasamy Department of Food Process Engineering, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India
  • Sudha Manickam Department of Plant Biotechnology, Centre for Plant Molecular Biology and Biotechnology, Tamil Nadu Agricultural University, Coimbatore-641003, Tamil Nadu, India

DOI:

https://doi.org/10.25081/jsa.2023.v7.8355

Keywords:

Sweet corn, Yield related traits, Correlation, Heritability, Descriptive statistics

Abstract

The present study was aimed at examining 14 biometric traits in the BC2F2 and BC2F3 generations of sweet corn from the cross SCM-Se-O-1 × DBT 17 with a view to determining high-yielding genotypes through variability and correlation studies. Statistical parameters such as mean values, genotypic and phenotypic coefficients of variation (GCV and PCV), heritability, and genetic advance as a percentage of the mean (GAM) were estimated. In both generations, the PCV was greater than the GCV for most of the traits, reflecting high environmental influence. The BC2F2 generation had a greater level of variability, while the BC2F3 generation reflected signs of stabilization of traits as well as positive skewness. High heritability with high GAM for cob weight and single plant yield reflects that these are controlled by additive gene effects and are amenable to efficient selection for improvement. Correlation analysis revealed single plant yield to be highly and significantly correlated with cob weight, cob length, number of kernels per row, and number of kernel rows per cob, particularly in the BC2F3 generation. Cob weight also reflected significant positive correlations with important yield components. The findings reflect the possibility of yield improvement of sweet corn through selection based on traits with high heritability and positive correlations.

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References

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Published

22-12-2023

How to Cite

Natesan, S., Chellamuthu, A., Chokkalingam, M., Balamurugan, M., Subburayan, S., Kandasamy, G., & Manickam, S. (2023). Variability studies of yield related traits and its correlation in advance segregating populations of sweet corn. Journal of Scientific Agriculture, 7, 82–90. https://doi.org/10.25081/jsa.2023.v7.8355

Issue

Volume 7, 2023

Section

Articles

Copyright (c) 2023 Senthil Natesan, Abikkumar Chellamuthu, Monisha Chokkalingam, Mohanapriya Balamurugan, Sivakumar Subburayan, Gurusamy Kandasamy, Sudha Manickam

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This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.