Sharma, Ravi, D P Bisen, Usha Shukla, and B G Sharma. “X-Ray Diffraction: A Powerful Method of Characterizing Nanomaterials”. Recent Research in Science and Technology 4, no. 8 (October 19, 2012). Accessed May 6, 2024. https://updatepublishing.com/journal/index.php/rrst/article/view/933.