Genetic Analysis of Triple Pistil Wheat Derived F2 Populations to Enhance Genetic Yield Potential

Abstract

Triple pistil (TP) wheat is a novel genetic resource which holds the ability to produce three grains in a single floret. In this research, TP wheat derived two F₂ populations were studied to investigate genetic variability, heritability, genetic advance, genetic correlation, inheritance pattern and potential of TP trait for grain yield improvement. Phenological data were recorded for 12 morpho-agronomic traits. Most of the traits exhibited significant genetic variability (P ? 0.05) for further trait improvement. Strong positive genetic correlations (r ? 0.99 at P ? 0.01) were computed within yield contributing and yield limiting traits, indicating common genes controlling these traits and opportunity for simultaneous improvement. Inheritance analysis indicated double dominant (15:1) and double recessive (9:7) epistatic ratios in investigated populations, proposing that TP trait was controlled by two nuclear epistatic genes. In conclusion, TP wheat is a valuable germplasm resource for grain yield improvement and floral development studies.